BGA100 eMMC100 Aging Burn-in Test Socket with USB Interface for BGA100 to USB

eMMC100 Aging Burn-in Test Socket with USB Interface for BGA100 to USB

Product Overview

This eMMC100 Aging Burn-in Test Socket is designed for programming, testing, reading, and writing to eMMC100 IC chips. It features an ITE IT1327 main control chip, built-in SD/MMC card power supply, and a high-speed USB 2.0 interface.

Key Features:

• **Main Control Chip:** ITE IT1327 with built-in SD/MMC card power supply and integrated 5V to 3.3V voltage regulator
• **High-Speed Interface:** USB 2.0 interface, backward compatible with USB 1.1
• **Integrated Transceiver:** UTMI and SIE for efficient data transfer
• **Power Mode:** Supports bus power mode
• **Hot-Plugging:** Supports hot-plugging and individual switching of the power supply
• **Floating Board Structure:** Precise positioning, easy access to ICs, and higher efficiency
• **Compatibility:** Applies to eMMC of Samsung, Sandisk, Toshiba, Hynix, and Intel
• **Socket Specifications:** 88pins, pin pitch 1.0mm, eMMC size 12x18mm (also available in 14x18mm)
• **eMMC Thickness:** Supports eMMC thickness of 0.6mm to 2.0mm
• **Testing Options:** Test can be carried out with or without balls
• **BGA Compatibility:** Applies to BGA 100
• **Easy Operation:** Easy operation by inserting USB into your PC directly

What's in the Box:

• 1 x Test Socket